IEEE NSS/MIC 2017 – Quality Assurance on a custom SiPMs array for the Mu2e experiment (poster)

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IEEE NSS/MIC 2017 – Quality Assurance on a custom SiPMs array for the Mu2e experiment (poster)

G. Pezzullo (INFN Pisa)

October 21, 2017 - October 28, 2017

Slides

Papers

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Details

Start:
October 21, 2017
End:
October 28, 2017
Event Category:
Website:
http://www.nss-mic.org/2017/welcome.asp

Venue

Hyatt Regency
Atlanta, GA United States + Google Map