BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//MUSE - ECPv4.1.3//NONSGML v1.0//EN
CALSCALE:GREGORIAN
METHOD:PUBLISH
X-WR-CALNAME:MUSE
X-ORIGINAL-URL:https://muse.lnf.infn.it
X-WR-CALDESC:Events for MUSE
BEGIN:VEVENT
DTSTART;VALUE=DATE:20171021
DTEND;VALUE=DATE:20171028
DTSTAMP:20260512T201052
CREATED:20170928
LAST-MODIFIED:20171123
UID:930-1508544000-1509235199@muse.lnf.infn.it
SUMMARY:IEEE NSS/MIC 2017 - Quality Assurance on a custom SiPMs array for the Mu2e experiment (poster)
DESCRIPTION:
URL:https://muse.lnf.infn.it/event/ieee-nssmic-2017-quality-assurance-custom-sipms-array-mu2e-experiment/
LOCATION:Atlanta\, GA\, United States
CATEGORIES:Talks
END:VEVENT
END:VCALENDAR