IEEE NSS/MIC 2017 – Quality Assurance on a custom SiPMs array for the Mu2e experiment (poster)

Loading Events
  • This event has passed.

IEEE NSS/MIC 2017 – Quality Assurance on a custom SiPMs array for the Mu2e experiment (poster)

G. Pezzullo (INFN Pisa)

October 21, 2017 - October 28, 2017

Details

Start:
October 21, 2017
End:
October 28, 2017
Event Category:
Website:
http://www.nss-mic.org/2017/welcome.asp

Venue

Hyatt Regency
Atlanta, GA United States + Google Map